This is an open access article distributed under the CC BY-NC-ND 4.0 terms and conditions.
Volume 11 article 267 pages: 217 - 223
main objective of this paper is to argue that the scientifi c approach to
reliability and safety is the only way forward for the reliability community if
accurate predictions regarding occurrences of negative functionability events
are to be made and subsequently verifi ed during the operational processes of
the future man made, managed and maintained systems. For that to happen, a
scientific understanding of the mechanisms that cause occurrences of
functionability events of the surrounding natural environment are required.
Then and only then, can accurate and meaningful reliability and safety predictions
become possible, enabling the ultimate goal of reducing the probability of
failure event occurrences during the life of man made, managed and maintained
systems. This paper focuses on the scientifi c understandings of the relevant
cosmic radiation on aviation reliability and safety
Authors wish that acknowledge the fi nancial support obtained from the Research Fund of the MIRCE Akademy that enabled this research to be performed.
Baumann, R., “ Radiation-induced soft errors in advanced semiconductor technologies, ” IEEE Transactions on Device and Materials Reliability, vol 5, No 3, pp. 305–316, Sept. 2005.
Knezevic, J. Time To Choose between Scientific and Administrative Approach to Reliability, Journal of Applied Engineering Science, No 3,. Year 2012, Vol 10. Belgrade, Serbia.
Knezevic, J/, Atoms and Molecules in Mirce Mechanics Approach to Reliability, SRESA Journal of Life Cycle Reliability and Safety Engineering, Vol 1, Issue 1, pp 15-25, Mumbai, India, 2012. ISSN-22500820
Zaczyk. I, “Analysis of the Infl uence of Atmospheric Radiation Induced Single Event Effects on Avionics Failures”, Master Dissertation, MIRCE Akademy, Exeter, UK, 2010.
C. H. Tsao, R. Silberberg, and J. R. Letaw, “Cosmic ray heavy ions at and above 40,000 feet, ”IEEE Trans. Nucl. Sci., vol. 31, pp. 1066–1068, Dec 1984.
R. Silberberg, C. H.
Tsao, and J. R Letaw, “Neutron generated single event upsets,” IEEE Trans.
Nucl. Sci., vol. 31, pp. 1183–1185, Dec 1984.